Rigaku MiniFlex 600 XRD

Benchtop X-ray diffractometer

  • Radiation source: Cu Kα (may cause fluorescence for Fe, Co, Ni, Cu, Mn, Zn)
  • 2Ө angle: 2° - 140°
  • Detector: D/teX Ultra with fluorescent reduction mode
  • Voltage – 40 kV
  • Current – 15 mA
  • 6 sample chamber