JEOL JEM-2100F FEGTEM
Instrument Manager: A/Prof. Laure Bourgeois
Instrument Location: G23 - Removed from service July 2019
Description: A high performance Schottky field emission transmission electron microscope with a broad range of techniques and applications. Equipped with electron energy loss spectroscopy (EELS), 3D tomographic imaging, furnace and liquid nitrogen specimen holders, and scanning transmission electron microscopy (STEM) with annular dark field (ADF) detectors.
Technical Configuration: 200 kV; FEG-TEM/STEM; high resolution pole piece; piezo stage; oil free pumping system; Gatan UltraScan 1000 (2kx2k) CCD camera; Gatan 692 Retractable TV camera; Gatan BF/ADF STEM detectors; JEOL BF/HAADF STEM detectors; Gatan 776 Enfina 1000 parallel detection EELS spectrometer; Gatan 777 STEM Pack; Gatan Diffraction Imaging; JEOL 50 mm2 Si(Li) EDX detector; Gatan EDX DigitalMicrograph plug-in; Gatan tomography software; Fischione Instruments 2030 Ultra-narrow gap advanced tomography holder; Gatan 655 turbo pumping station.