JEOL JSM-7001F FEGSEM
Instrument Manager: Dr Xi-Ya Fang
Instrument Location: G36
Description: Excellent analytical microscope capable of large probe currents making it ideal for x-ray mapping and EBSD acquisition. The large specimen exchange airlock and large working distance make this a suitable microscope for analysing tall samples requiring large depth of field.
Technical Configuration: FEG; 5-axis stage; IR chamber camera; oil-free pumping system; retractable-BSE detector; specimen exchange airlock; cryo-trap; Oxford Instruments AZtec X-ray analysis system and 80mm2 SDD; Oxford Instruments Nordlys Max2 EBSD detector.