JEOL JSM-7001F FEGSEM

JEOL JSM-7001F FEGSEM

Instrument Manager: Dr Xi-Ya Fang

Instrument Location: G36

Description: Excellent analytical microscope capable of large probe currents making it ideal for x-ray mapping and EBSD acquisition. The large specimen exchange airlock and large working distance make this a suitable microscope for analysing tall samples requiring large depth of field.

Technical Configuration: FEG; 5-axis stage; IR chamber camera; oil-free pumping system; retractable BSE detector; specimen exchange airlock; cryo-trap; Oxford Instruments AZtec X-ray analysis system and 80mm2 SDD; Oxford Instruments Nordlys Max2 EBSD detector.