X-ray Photoelectron Spectroscopy (XPS)

X-ray photoelectron spectroscopy (XPS) is a surface analysis technique that measures the elemental composition, chemical states and electronic states of the elements within a material. XPS spectra are obtained by irradiating a material with a focused beam of X-rays and measuring the number and kinetic energy of the ejected electrons from the top 10 nm of the material being analysed. XPS requires ultra-high vacuum (<10-9 mbar) conditions and is a powerful technique as it not only identifies elements present, but also provides information on what other elements they are bonded to.

The Monash X-ray Platform is home to a Thermo Nexsa Surface Analysis system which utilises XPS as well as the following techniques:

  • Ultra-violet Photoelectron Spectroscopy (UPS) - Valence band and work function measurements
  • Vacuum transfer module for air sensitive samples
  • Ion gun enabled elemental composition depth profile analysis and surface cleaning of both soft and hard materials
  • Angle resolved XPS (ARXPS) – non-destructive information on the thickness and composition of ultra-thin films
  • Ion scattering spectroscopy (ISS) – Elemental composition of the outermost atomic layer
  • Reflected electron energy loss spectroscopy – electronic structure (e.g. band gap) measurements and hydrogen detection
  • XPS Mapping

Our XPS service is used across a wide variety of research fields from energy materials, catalysis, metallurgy and nanofab to dairy, polymers, biomed and pharmaceuticals.