XRD or XPS Mapping

Mapping a sample can be useful to understand how the structure or composition changes across the surface.

Our XRD mapping capability can be used to analyse materials such as 4 inch wafers, additively manufactured parts and metals and alloys. Areas up to 80 mm² can be mapped with a 1 mm spatial resolution.

XPS mapping capability measures the distribution of elements or chemical states across a material's surface. The technique we use, SnapMap, moves the sample stage though the stationary X-ray beam so that the X-ray spot is effectively rastered across the selected area of the sample surface. Snapshot XPS spectra are recorded continuously during rastering and processed to form a XPS image of the sample surface with each pixel point representing an individual snapshot XPS spectrum. Areas up to 3 mm² can be mapped and features as small as 10 um can be identified.