Thermo Scientific Talos F200i FEGTEM

Instrument Manager: Dr Tim Williams

Instrument Location: G18

Description:  The 200 kV Talos X-FEG (S)TEM is a highly flexible, high-throughput system suitable for a wide range of nanoscale imaging and analytical applications. TEM/STEM imaging and EDS analysis are performed using the Velox software platform, ensuring consistency across the MCEM TEM fleet.

The accelerating voltage is selectable between 80–200 kV. A SmartCam digital search-and-view system replaces the traditional fluorescent screen, enabling full laboratory-light operation and providing live diffraction, FFT, and false-colour imaging for alignment and navigation. The oil-free vacuum system reduces vibration and contamination risks during operation.

The X-Twin pole piece provides high-resolution imaging (2.5 Å point resolution in TEM; 1.6 Å in STEM) with stable, user-friendly operation. TEM data are collected using the 16-MP CETA camera (4k × 4k at up to 40 fps). In STEM mode, Panther BF/DF and HAADF detectors support a broad range of imaging modes. Apertures and beam stop are fully software-controlled.

The microscope includes a 100 mm² Bruker X-Flash 7T SDD (129 eV at Mn Kα), providing nanometre-scale STEM-EDS mapping with rapid acquisition enabled by the high-brightness X-FEG emitter. Align Genie software simplifies alignments, reducing training time and improving data reproducibility. A long-duration LN₂ Dewar eliminates user handling of cryogenics.

Technical Configuration: 80–200 kV, X-FEG source; X-Twin objective; 1.6 Å STEM / 2.5 Å TEM resolution; Velox software; SmartCam viewing system; speed enhanced 4k × 4k CETA 16M camera (40 fps); Panther BF/DF, HAADF detectors; 100 mm² Bruker 7T SDD (129 eV); oil-free vacuum system; long-duration LN₂ cold trap.