Thermo Scientific Spectra Ultra FEGTEM
Instrument Manager: Dr Tim Williams
Instrument Location: G17
Description: The Spectra Ultra 300 kV (S)TEM is a conventional (non-aberration-corrected) instrument delivering analytical performance approaching that of corrected systems. With an operational range of 30–300 kV and rapid voltage switching, it is optimised for high-sensitivity STEM-EDS and especially suited to beam-sensitive materials. Except for manual sample loading/unloading, every operation is Velox software controlled including detector configurations, apertures and beam stop.
The system incorporates a TFS X-CFEG emitter (cold FEG), providing ultrahigh brightness with intrinsic energy resolution of <0.4 eV (14 nA) and <0.3 eV (2 nA). STEM spatial resolution exceeds 1.36 Å, enabled by highly stable instrument architecture.
The Ultra-X EDX detector provides a collection solid angle >4.45 sr—approaching an order of magnitude greater than conventional EDS systems—enabling atomic-scale analytical resolution at significantly reduced acquisition times or at lower beam current to minimise specimen damage.
Like the Talos, the Ultra includes SmartCam viewing, a speed enhanced 4k × 4k CETA-S camera (40 fps), Panther BF/DF, HAADF and segmented STEM detectors, auto alignment software, an oil-free vacuum system, and long-duration LN2 Dewar. Additional capabilities include 4D STEM on the CETA-S camera, Lorentz TEM, precession diffraction, tomography (TEM/STEM/EDS), and automated large-area EDS mapping.
Technical Configuration: 30–300 kV, X-CFEG source; <0.4 eV intrinsic energy resolution; <1.4 Å STEM resolution; <1Å TEM information limit; SmartCam; Ultra-X EDS; speed enhanced 4k × 4k CETA-S camera; BF/DF + HAADF + segmented STEM detectors + 4D STEM; auto alignment; precession diffraction; Lorentz mode; oil-free vacuum; long-duration cold trap.