New X-ray imaging technique could double scanning efficiency while revealing hidden detail
X-ray phase-contrast image of a seashell, cleanly separated from an overlapping coral sample via DSI. Credit: Zdora et al., Monash University
Researchers at Monash University have developed a new X-ray imaging technique that can image two overlapping samples at the same time, potentially doubling scanning efficiency while opening new possibilities for industrial inspection and scientific research.
The technique, called dual-sample multimodal imaging (DSI), captures detailed information from two objects in a single scan.
Unlike conventional multimodal X-ray imaging, which can only analyse one sample at a time, DSI separates and reconstructs images of both overlapping objects without requiring additional scans.
The breakthrough could improve inspection processes in areas such as microelectronics, advanced manufacturing, materials science and the life sciences, where imaging speed and efficiency are critical.
Lead researcher Dr Marie-Christine Zdora, from the School of Physics and Astronomy, said the team’s approach challenged a long-held assumption in X-ray imaging.
"Instead of treating a second object as something that gets in the way of seeing the other sample, we use it to help create the image," Dr Zdora said.
"Each sample effectively becomes part of the imaging system for the other, allowing us to recover detailed information about both objects from the same dataset."
Modern multimodal X-ray imaging provides more than a standard X-ray picture. Along with conventional absorption images, it also reveals phase contrast and dark-field information, offering additional insight into the internal structure of materials that would otherwise remain invisible.
The researchers confirmed the new method by comparing it with an established multimodal X-ray imaging technique. Across a range of biological samples and microelectronic devices, DSI produced image quality comparable to the conventional approach while simultaneously imaging two samples.
Dr Zdora said the work was a proof of principle that could eventually lead to faster, more efficient imaging systems.
"Our study shows that we can recover high-quality images from two samples simultaneously without a substantial loss in image quality," she said.
"In the future, we hope to extend the technique to three-dimensional imaging and translate it from synchrotron facilities to laboratory-based X-ray systems, bringing it closer to practical industrial applications."
The researchers say future applications could include inspection of electronic components, composite materials, pharmaceuticals and packaged foods, as well as imaging for biological and medical research.
The study, Dual-sample multimodal X-ray imaging, is published in Optica.
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