Scanning Electron Microscope Facility

Technical details

The FEI Quanta 600 MLA Scanning Electron Microscope (SEM) has a W-filament electron source and is equipped with

  • Secondary electron (SE) detector – used to image surface morphology
  • Back scatter electron (BSE) detector – the intensity of the BSE signal is strongly correlated with atomic number of the element in a sample
  • Energy dispersive (EDAX) detector – characteristic X-rays can be used to identify the elements in a sample. A semi-quantitative analysis of elements generally enables mineral phase identification
  • Cathodoluminescence (CL) detector – some minerals emit light when bombarded with electrons MLA mode enables mapping samples – at this stage we can either do a relatively quick BSE map or BSE+EDAX to identify mineral phases. Other options are available (currently still being explored). Work in progress: Quant EDX for major elements (with NIST DTSA-II).

Contact us

For more information on this laboratory and its capabilities please contact:
9905 0827